Strong-Field Bloch Electron Interferometry for Band Structure Retrieval
Tobias Weitz, Christian Heide, Peter Hommelhoff

TL;DR
This paper introduces a novel strong-field interferometry technique using Landau-Zener transitions in Bloch electrons to directly measure band structures, demonstrated by determining graphene's Fermi velocity with high precision.
Contribution
The work presents a new method, strong-field Bloch electron interferometry, for retrieving band structure information with femtosecond resolution in solid materials.
Findings
Measured graphene's Fermi velocity as (1.07±0.04) nm/fs near K points.
Demonstrated the feasibility of band structure retrieval using strong-field interferometry.
Applicable to various materials for real-time band structure analysis.
Abstract
When Bloch electrons in a solid are exposed to a strong optical field, they are coherently driven in their respective bands where they acquire a quantum phase as the imprint of the band shape. If an electron approaches an avoided crossing formed by two bands, it may be split by undergoing a Landau-Zener transition. We here employ subsequent Landau-Zener transitions to realize strong-field Bloch electron interferometry (SFBEI), allowing us to reveal band structure information. In particular, we measure the Fermi velocity (band slope) of graphene in the vicinity of the K points as (1.070.04) nm fs. We expect SFBEI for band structure retrieval to apply to a wide range of material systems and experimental conditions, making it suitable for studying transient changes in band structure with femtosecond temporal resolution at ambient conditions.
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Taxonomy
TopicsSpectroscopy and Quantum Chemical Studies · Advanced Electron Microscopy Techniques and Applications · Force Microscopy Techniques and Applications
