Hidden phase uncovered by ultrafast carrier dynamics in thin Bi2O2Se
Hao Li, Adeela Nairan, Xiaoran Niu, Yuxiang Chen, Huarui Sun, Linqing, Lai, Jingkai Qin, Leyang Dang, Guigen Wang, Usman Khan, Feng He

TL;DR
This study investigates ultrafast carrier dynamics in thin Bi2O2Se films, revealing a ferroelectric transition in films thinner than 8 nm influenced by strain and non-equilibrium states, advancing understanding of their phase behavior.
Contribution
It provides a systematic analysis of thickness and fluence effects on carrier dynamics and uncovers a ferroelectric transition in ultrathin Bi2O2Se films, which was not previously well understood.
Findings
Ferroelectric transition occurs in Bi2O2Se films thinner than 8 nm.
Strain and non-equilibrium states influence the ferroelectric phase.
Ultrafast spectroscopy reveals thickness-dependent carrier dynamics.
Abstract
Bi2O2Se has attracted intensive attention due to its potential in electronics, optoelectronics, as well as ferroelectric applications. Despite that, there have only been a handful of experimental studies based on ultrafast spectroscopy to elucidate the carrier dynamics in Bi2O2Se thin films, Different groups have reported various ultrafast timescales and associated mechanisms across films of different thicknesses. A comprehensive understanding in relation to thickness and fluence is still lacking. In this work, we have systematically explored the thickness-dependent Raman spectroscopy and ultrafast carrier dynamics in chemical vapor deposition (CVD)-grown Bi2O2Se thin films on mica substrate with thicknesses varying from 22.44 nm down to 4.62 nm at both low and high pump fluence regions. Combining the thickness dependence and fluence dependence of the slow decay time, we demonstrate a…
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Advanced Thermoelectric Materials and Devices · 2D Materials and Applications
