The Bi-O-edge wavefront sensor: How Foucault-knife-edge variants can boost eXtreme Adaptive Optics

TL;DR

This paper introduces the Bi-O-edge wavefront sensor, inspired by the Foucault knife edge test, which can potentially double measurement sensitivity compared to classical Pyramid Wavefront Sensors, especially for high-order adaptive optics in exoplanet imaging.

Contribution

The paper proposes a novel wavefront sensor design, the Bi-O-edge, with two implementation concepts and analyzes its sensitivity advantages over traditional sensors in high-order AO systems.

Findings

Bi-O-edge sensor can halve photon requirements compared to PWS.

Sensitivity gain depends on control modes and modulation angle.

Sharp Bi-O-edge approaches a factor of 2 sensitivity improvement.

Abstract

Direct detection of exoplanets around nearby stars requires advanced Adaptive Optics (AO) systems. High order systems are needed to reach high Strehl Ratio (SR) in near infrared and optical wavelengths on future Giant Segmented Mirror Telescopes (GSMTs). Direct detection of faint exoplanets with the ESO ELT will require some tens of thousand of correction modes. Resolution and sensitivity of the wavefront sensor (WFS) are key requirements for this science case. We present a new class of WFSs, the Bi-Orthogonal Foucault-knife-edge Sensors (or Bi-O-edge), that is directly inspired by the Foucault knife edge test (Foucault 1859). The idea consists of using a beam-splitter producing two foci, each of which is sensed by an edge with orthogonal direction to the other. We describe two implementation concepts: The Bi-O-edge sensor can be realised with a sharp edge and a tip-tilt modulation device (sharp Bi-O-edge) or with a smooth gradual transmission over a grey edge (grey Bi-O-edge). A comparison between the Bi-O-edge concepts and the 4-sided classical Pyramid Wavefront Sensor (PWS) gives some important insights into the nature of the measurements.Our analysis shows that the sensitivity gain of the Bi-O edge with respect to the PWS depends on the system configuration. The gain is a function of the number of control modes and the modulation angle. We found that for the sharp Bi-O-edge, the gain in reduction of propagated photon noise variance approaches a theoretical factor of 2 for a large number of control modes and small modulation angle, meaning that the sharp Bi-O-edge only needs half of the photons of the PWS to reach similar measurement accuracy.