PolyLUT: Learning Piecewise Polynomials for Ultra-Low Latency FPGA LUT-based Inference
Marta Andronic, George A. Constantinides

TL;DR
This paper introduces PolyLUT, a novel neural network training method that uses multivariate polynomials within FPGA LUTs to significantly reduce latency and area for deep learning inference across various applications.
Contribution
It proposes a new approach to FPGA neural network deployment by leveraging polynomial functions in LUTs, enabling fewer layers and improved efficiency.
Findings
Achieves comparable accuracy with fewer layers using polynomial blocks.
Reduces latency and FPGA resource usage significantly.
Demonstrates effectiveness on intrusion detection, particle physics, and digit recognition tasks.
Abstract
Field-programmable gate arrays (FPGAs) are widely used to implement deep learning inference. Standard deep neural network inference involves the computation of interleaved linear maps and nonlinear activation functions. Prior work for ultra-low latency implementations has hardcoded the combination of linear maps and nonlinear activations inside FPGA lookup tables (LUTs). Our work is motivated by the idea that the LUTs in an FPGA can be used to implement a much greater variety of functions than this. In this paper, we propose a novel approach to training neural networks for FPGA deployment using multivariate polynomials as the basic building block. Our method takes advantage of the flexibility offered by the soft logic, hiding the polynomial evaluation inside the LUTs with minimal overhead. We show that by using polynomial building blocks, we can achieve the same accuracy using…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdversarial Robustness in Machine Learning · Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing
