Reflection imaging with a helium zone plate microscope

TL;DR

This paper introduces the first reflection imaging using a focused helium beam with a helium zone plate microscope, achieving micrometer-scale resolution and measuring scattering distributions, advancing surface-sensitive microscopy techniques.

Contribution

It demonstrates reflection imaging with a focused helium beam and measures scattering distributions, a novel application of helium zone plate microscopy.

Findings

Achieved reflection images with a 4.7 μm spot size.

Focused helium beam down to about 1 μm.

First measurement of scattering distribution from a focused helium beam.

Abstract

Neutral helium atom microscopy is a novel microscopy technique that offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot across a surface and recording the variation in scattered intensity at a fixed total scattering angle $\theta_{sd}$ and fixed incident angle $\theta_{i}$ relative to the overall surface normal. These experiments used a spot obtained by collimating the beam (referred to as helium pinhole microscopy). Alternatively, a beam spot can be created by focusing the beam with an atom optical element. However up till now imaging with a focused helium beam (referred to as helium zone plate microscopy) has only been demonstrated in transmission. Here we present the first reflection images obtained with a focused helium beam. Images are obtained with a spot size (FWHM) down to 4.7 $\mu$m $\pm$ 0.5 $\mu$m, and we demonstrate focusing down to a spot size of about 1 $\mu$m. Furthermore, we present the first experiments measuring the scattering distribution from a focused helium beam spot. The experiments are done by varying the incoming beam angle $\theta_{i}$ while keeping the beam-detector angle $\theta_{sd}$ and the point where the beam spot hits the surface fixed - in essence, a microscopy scale realization of a standard helium atom scattering experiment. Our experiments are done using an electron bombardment detector with adjustable signal accumulation, developed particularly for helium microscopy.