A Method To Characterize Metalenses For Light Collection Applications
T. Contreras, A. Martins, C. Stanford, C. O. Escobar, R. Guenette, M., stancari, J. Martin-Albo, B. Lawrence-Sanderson, A. Para, A. Kish, F., Kellerer

TL;DR
This paper introduces a detailed characterization method for metalenses, focusing on their efficiency in concentrating monochromatic light across various angles, which is crucial for optimizing light collection in detectors.
Contribution
The paper presents a novel method to evaluate metalenses' light-concentrating efficiency over a range of incident angles, independent of imaging performance.
Findings
Effective characterization of metalenses for wide-angle light collection.
Quantitative assessment of metalenses' light concentration efficiency.
Potential improvements in detector light collection systems.
Abstract
Metalenses and metasurfaces are promising emerging technologies that could improve light collection in light collection detectors, concentrating light on small area photodetectors such as silicon photomultipliers. Here we present a detailed method to characterize metalenses to assess their efficiency at concentrating monochromatic light coming from a wide range of incidence angles, not taking into account their imaging quality.
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Taxonomy
TopicsAdvanced Semiconductor Detectors and Materials · Thermal Radiation and Cooling Technologies · Advanced Optical Sensing Technologies
