Fast modeling of regenerative amplifier free-electron lasers
River R. Robles, Aliaksei Halavanau, Gabriel Marcus, Zhirong Huang

TL;DR
This paper introduces a semi-analytical, fast modeling approach for regenerative amplifier free-electron lasers (RAFELs), enabling efficient analysis of stability and misalignment effects in high-gain x-ray FEL systems.
Contribution
The paper presents a semi-analytical model that significantly reduces simulation time for x-ray RAFELs, incorporating realistic errors and electron trajectories for stability analysis.
Findings
Efficient modeling of x-ray FEL cavities with errors
Insights into electron-optical overlap stability
Applicability to other wavelengths with optics adjustments
Abstract
High-gain free-electron lasers (FELs) are becoming important light sources at short wavelengths such as the EUV and X-ray regimes. A particularly promising concept is the regenerative amplifier FEL (RAFEL), which can greatly increase the brightness and stability of a single pass device. One of the critical challenges of the x-ray RAFEL is maintaining electron-optical overlap over the relatively large (hundreds of meters) footprint of the system. Numerical modeling of x-ray RAFELs with angular and positional errors is critical for designing stable cavities, as well as to predict signatures of specific misalignment effects. Full-scale simulations of x-ray FELs are incredibly time-consuming, making large-scale parameter searches intractable on reasonable timescales. In this paper, we present a semi-analytical model that allows to investigate realistic scenarios - x-ray cavity without gain…
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Taxonomy
TopicsParticle Accelerators and Free-Electron Lasers · Advanced X-ray Imaging Techniques · Advanced Electron Microscopy Techniques and Applications
