A first-principles approach to closing the "10-100 eV gap" for charge-carrier thermalization in semiconductors
Dallin O. Nielsen, Chris G. Van de Walle, Sokrates T. Pantelides,, Ronald D. Schrimpf, Daniel M. Fleetwood, and Massimo V. Fischetti

TL;DR
This study uses first-principles calculations to accurately model charge-carrier thermalization in semiconductors within the previously poorly understood 10-100 eV energy gap, combining DFT and Monte Carlo simulations.
Contribution
It introduces an ab initio approach to analyze energy-loss processes in the 10-100 eV range, bridging a critical knowledge gap in semiconductor physics.
Findings
Full thermalization occurs within ~1 ps for electrons and ~0.5 ps for holes.
Electrons lose about 90% of their energy within 0.1 fs via plasmon emission and impact ionization.
Hot electrons generate multiple electron-hole pairs during thermalization.
Abstract
The present work is concerned with studying accurately the energy-loss processes that control the thermalization of hot electrons and holes that are generated by high-energy radiation in wurtzite GaN, using an ab initio approach. Current physical models of the nuclear/particle physics community cover thermalization in the high-energy range (kinetic energies exceeding ~100 eV), and the electronic-device community has studied extensively carrier transport in the low-energy range (below ~10 eV). However, the processes that control the energy losses and thermalization of electrons and holes in the intermediate energy range of about 10-100 eV (the "10-100 eV gap") are poorly known. The aim of this research is to close this gap, by utilizing density functional theory (DFT) to obtain the band structure and dielectric function of GaN for energies up to about 100 eV. We also calculate…
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Taxonomy
TopicsGaN-based semiconductor devices and materials · Advancements in Semiconductor Devices and Circuit Design · Semiconductor materials and devices
