Variational Label-Correlation Enhancement for Congestion Prediction
Biao Liu, Congyu Qiao, Ning Xu, Xin Geng, Ziran Zhu, Jun Yang

TL;DR
This paper introduces a novel congestion prediction method that leverages variational inference to incorporate spatial label-correlation between neighboring grids, significantly improving prediction accuracy for large-scale IC design routing.
Contribution
The paper proposes {ours}, a new approach that models local spatial label-correlation in congestion maps using variational inference, enhancing prediction performance over existing methods.
Findings
Outperforms existing congestion prediction methods on ISPD2011 and DAC2012 benchmarks.
Effectively captures spatial dependencies between neighboring grids.
Improves accuracy and reliability of congestion predictions in large-scale IC routing.
Abstract
The physical design process of large-scale designs is a time-consuming task, often requiring hours to days to complete, with routing being the most critical and complex step. As the the complexity of Integrated Circuits (ICs) increases, there is an increased demand for accurate routing quality prediction. Accurate congestion prediction aids in identifying design flaws early on, thereby accelerating circuit design and conserving resources. Despite the advancements in current congestion prediction methodologies, an essential aspect that has been largely overlooked is the spatial label-correlation between different grids in congestion prediction. The spatial label-correlation is a fundamental characteristic of circuit design, where the congestion status of a grid is not isolated but inherently influenced by the conditions of its neighboring grids. In order to fully exploit the inherent…
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Taxonomy
TopicsVLSI and FPGA Design Techniques · Integrated Circuits and Semiconductor Failure Analysis · VLSI and Analog Circuit Testing
MethodsVariational Inference
