Field-Emission Resonances in Thin Metallic Films: Nonexponential Decay of the Tunneling Current as a Function of the Sample-to-Tip Distance
A. Yu. Aladyshkin, K. Schouteden

TL;DR
This study investigates field-emission resonances (FERs) in thin Pb(111) films using STM/STS, revealing quantized states, their evolution with bias voltage, and their impact on tunneling current decay, advancing understanding of electron emission at the nanoscale.
Contribution
It provides a detailed experimental analysis of FER states, their quantized nature, and their influence on tunneling current decay, highlighting nonexponential behavior at high biases.
Findings
FERs exist at quantized sample-to-tip distances above the surface.
The difference between neighboring FER lines is independent of the resonance index for higher states.
Periodic variations of ln I as a function of Z allow height estimation of the tip.
Abstract
Field-emission resonances (FERs) for two-dimensional Pb(111) islands grown on \mbox{Si(111)77} surfaces were studied by low-temperature scanning tunneling microscopy and spectroscopy (STM/STS) in a broad range of tunneling conditions with both active and disabled feedback loop. These FERs exist at quantized sample-to-tip distances above the sample surface, where is the serial number of the FER state. By recording the trajectory of the STM tip during ramping of the bias voltage (while keeping the tunneling current fixed), we obtain the set of the values corresponding to local maxima in the derived spectra. This way, the continuous evolution of as a function of for all FERs was investigated by STS experiments with active feedback loop for different . Complementing these measurements by current-distance spectroscopy at…
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