Simple few-shot method for spectrally resolving the wavefront of an ultrashort laser pulse

TL;DR

This paper introduces a simple, minimally invasive method for spectrally resolving the wavefront of ultrashort laser pulses using a pinhole mask and speckle pattern analysis, suitable for single-shot diagnostics.

Contribution

The authors propose a novel, straightforward approach for spatio-spectral characterization of ultrashort pulses that is scalable, minimally intrusive, and compatible with single-shot measurements.

Findings

Successfully retrieved chromatic aberrations like pulse front tilt and curvature

Demonstrated effectiveness with spherical lens aberrations

Method is simple, scalable, and suitable for high-intensity laser diagnostics

Abstract

We present a novel and straightforward approach for the spatio-spectral characterization of ultrashort pulses. This minimally intrusive method relies on placing a mask with specially arranged pinholes in the beam path before the focusing optic and retrieving the spectrally-resolved laser wavefront from the speckle pattern produced at focus. We test the efficacy of this new method by accurately retrieving chromatic aberrations, such as pulse front tilt, pulse front curvature, and higher-order aberrations introduced by a spherical lens. The simplicity and scalability of this method, combined with its compatibility with single-shot operation, make it a promising candidate to become a new standard diagnostic tool in high-intensity laser facilities.