Raman spectroscopy of monolayer to bulk PtSe2 exfoliated crystals

TL;DR

This study uses Raman spectroscopy to analyze exfoliated PtSe2 crystals from monolayer to bulk, revealing layer-dependent signatures and quality metrics for this transition metal dichalcogenide.

Contribution

It provides the first detailed Raman spectral analysis of exfoliated PtSe2 from 1 to 10 layers, establishing reference signatures for layer identification and quality assessment.

Findings

Raman signatures clearly distinguish different layer thicknesses.

Record linewidths observed in Raman spectra.

Provides reference metrics for crystal quality evaluation.

Abstract

Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on $\rm{PtSe_2}$, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline $\rm{PtSe_2}$ can be grown with various crystalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1 to 10 layers $\rm{PtSe_2}$ by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films.