Rapid and Scalable Bayesian AB Testing
Srivas Chennu, Andrew Maher, Christian Pangerl, Subash Prabanantham,, Jae Hyeon Bae, Jamie Martin, Bud Goswami

TL;DR
This paper introduces a hierarchical Bayesian approach to AB testing that enhances statistical power, allows for early stopping, and leverages past data to improve decision-making in digital experiments.
Contribution
It presents a novel hierarchical Bayesian methodology that overcomes limitations of traditional AB testing, including multivariate analysis, sequential testing, and knowledge pooling from previous tests.
Findings
Increases statistical power compared to traditional methods.
Enables early stopping without increasing false positives.
Demonstrates effectiveness through simulations and real-world AB tests.
Abstract
AB testing aids business operators with their decision making, and is considered the gold standard method for learning from data to improve digital user experiences. However, there is usually a gap between the requirements of practitioners, and the constraints imposed by the statistical hypothesis testing methodologies commonly used for analysis of AB tests. These include the lack of statistical power in multivariate designs with many factors, correlations between these factors, the need of sequential testing for early stopping, and the inability to pool knowledge from past tests. Here, we propose a solution that applies hierarchical Bayesian estimation to address the above limitations. In comparison to current sequential AB testing methodology, we increase statistical power by exploiting correlations between factors, enabling sequential testing and progressive early stopping, without…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsVLSI and Analog Circuit Testing · Industrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis
