Controlling hydrocarbon transport and electron beam induced deposition on single layer graphene: toward atomic scale synthesis in the scanning transmission electron microscope
Ondrej Dyck, Andrew R. Lupini, Philip D. Rack, Jason Fowlkes, Stephen, Jesse

TL;DR
This paper explores controlling hydrocarbon contamination during electron beam induced deposition on graphene, demonstrating a method to maintain atomic cleanliness by using e-beam deposition to corral hydrocarbons at high temperatures.
Contribution
It introduces a novel strategy of using e-beam deposition to contain hydrocarbons, enabling atomic-scale synthesis on graphene at elevated temperatures.
Findings
Corralled hydrocarbons prevent unwanted deposition.
High-temperature cleaning reduces surface hydrocarbons.
E-beam deposition effectively controls hydrocarbon migration.
Abstract
Focused electron beam induced deposition (FEBID) is a direct write technique for depositing materials on a support substrate akin to 3D printing with an electron beam (e-beam). Opportunities exist for merging this existing technique with aberration-corrected scanning transmission electron microscopy to achieve molecular- or atomic-level spatial precision. Several demonstrations have been performed using graphene as the support substrate. A common challenge that arises during this process is e-beam-induced hydrocarbon deposition, suggesting greater control over the sample environment is needed. Various strategies exist for cleaning graphene in situ. One of the most effective methods is to rapidly heat to high temperatures, e.g., 600 C or higher. While this can produce large areas of what appears to be atomically clean graphene, mobile hydrocarbons can still be present on the surfaces.…
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