Idealizing Tauc Plot for Accurate Bandgap Determination of Semiconductor with UV-Vis: A Case Study for Cubic Boron Arsenide
Hong Zhong, Fengjiao Pan, Shuai Yue, Chengzhen Qin, Viktor Hadjiev,, Fei Tian, Xinfeng Liu, Feng Lin, Zhiming Wang, Zhifeng Ren, Jiming Bao

TL;DR
This paper introduces a baseline removal method for UV-Vis Tauc plots to improve the accuracy of semiconductor bandgap determination, demonstrated on cubic boron arsenide and verified experimentally.
Contribution
It proposes a novel baseline correction technique for Tauc plots, addressing inaccuracies caused by baseline absorption in bandgap measurements.
Findings
Baseline removal improves bandgap accuracy.
Method converges previous discrepancies in c-BAs bandgap values.
Applicable to both direct and indirect bandgap semiconductors.
Abstract
The Tauc plot method is widely used to determine the bandgap of semiconductors via UV-visible optical spectroscopy due to its simplicity and perceived accuracy. However, the actual Tauc plot often exhibits significant baseline absorption below the expected bandgap, leading to discrepancies in the calculated bandgap depending on whether the linear fit is extrapolated to zero or non-zero baseline. In this study, we show that both extrapolation methods can produce significant errors by simulating Tauc plots with varying levels of baseline absorption. To address this issue, we propose a new method that involves idealizing the absorption spectrum by removing its baseline before constructing the Tauc plot. Experimental verification of this method using a gallium phosphide (GaP) wafer with intentionally introduced baseline absorptions shows promising results. Furthermore, we apply this new…
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Taxonomy
TopicsChalcogenide Semiconductor Thin Films · Advanced Semiconductor Detectors and Materials · Thermal properties of materials
