Noise-to-Norm Reconstruction for Industrial Anomaly Detection and Localization
Shiqi Deng, Zhiyu Sun, Ruiyan Zhuang, Jun Gong

TL;DR
This paper introduces a noise-to-norm reconstruction method for industrial anomaly detection that effectively reconstructs anomalies into normal patterns, improving detection and localization accuracy especially on datasets with large positional variations.
Contribution
It proposes a novel noise-to-norm reconstruction approach using an M-net with multiscale fusion and residual attention, enhancing anomaly detection and localization performance.
Findings
Achieved state-of-the-art results on the MPDD dataset.
Demonstrated superior anomaly localization accuracy.
Effective in reconstructing anomalous regions into normal patterns.
Abstract
Anomaly detection has a wide range of applications and is especially important in industrial quality inspection. Currently, many top-performing anomaly-detection models rely on feature-embedding methods. However, these methods do not perform well on datasets with large variations in object locations. Reconstruction-based methods use reconstruction errors to detect anomalies without considering positional differences between samples. In this study, a reconstruction-based method using the noise-to-norm paradigm is proposed, which avoids the invariant reconstruction of anomalous regions. Our reconstruction network is based on M-net and incorporates multiscale fusion and residual attention modules to enable end-to-end anomaly detection and localization. Experiments demonstrate that the method is effective in reconstructing anomalous regions into normal patterns and achieving accurate…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAnomaly Detection Techniques and Applications · Fault Detection and Control Systems · Industrial Vision Systems and Defect Detection
