Isotropic plasma-thermal atomic layer etching of superconducting TiN films using sequential exposures of molecular oxygen and SF$_6/$H$_2$ plasma
Azmain A. Hossain, Haozhe Wang, David S. Catherall, Martin Leung, Harm, C. M. Knoops, James R. Renzas, Austin J. Minnich

TL;DR
This paper introduces an isotropic plasma-thermal atomic layer etching process for superconducting TiN films using sequential molecular oxygen and SF$_6$/H$_2$ plasma exposures, achieving precise etch control with minimal damage, suitable for quantum device applications.
Contribution
The study develops a new TiN ALE process with self-limiting etching and demonstrates its low-damage impact on superconducting properties, advancing fabrication techniques for quantum technologies.
Findings
Selective etching of TiO$_2$ over TiN achieved
Etch rates vary with temperature from 1.1 to 3.2 Å/cycle
Superconducting critical temperature remains stable after etching
Abstract
Microwave loss in superconducting titanium nitride (TiN) films is attributed to two-level systems in various interfaces arising in part from oxidation and microfabrication-induced damage. Atomic layer etching (ALE) is an emerging subtractive fabrication method which is capable of etching with Angstrom-scale etch depth control and potentially less damage. However, while ALE processes for TiN have been reported, they either employ HF vapor, incurring practical complications; or the etch rate lacks the desired control. Further, the superconducting characteristics of the etched films have not been characterized. Here, we report an isotropic plasma-thermal TiN ALE process consisting of sequential exposures to molecular oxygen and an SF/H plasma. For certain ratios of SF:H flow rates, we observe selective etching of TiO over TiN, enabling self-limiting etching within a…
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Taxonomy
TopicsPlasma Diagnostics and Applications · Metal and Thin Film Mechanics · Semiconductor materials and devices
