Old but Not Obsolete: Dimensional Analysis in Nondestructive Testing and Evaluation
Tamburrino Antonello, Sardellitti Alessandro, Milano Filippo, Mottola, Vincenzo, Laracca Marco, Ferrigno Luigi

TL;DR
This paper pioneers the application of dimensional analysis, specifically Buckingham's π theorem, to Non-Destructive Testing and Evaluation, enabling simple, effective, and real-time estimation of multiple parameters like thickness and conductivity.
Contribution
It introduces the novel use of dimensional analysis in NDT&E, demonstrating a systematic, efficient method for simultaneous parameter estimation validated through experiments.
Findings
Effective estimation of thickness and conductivity in a conducting plate
High accuracy across a wide range of parameters
Suitable for real-time industrial applications
Abstract
This paper introduces dimensional analysis in Non-Destructive Testing & Evaluation (NDT&E) problems. This is the first time that this approach is adopted in the framework of NDT&E, and the paper opens to the development of probes and methods to simultaneously estimate several parameters with a simple approach. The most important theorem of dimensional analysis is the Buckingham's {\pi} theorem, based on the concept that the laws of the physics do not depend on the particular set of units chosen. The core of this theorem is a systematic reduction in the number of variables describing a physical problem. This reduction is equal to , the number of fundamental dimensions required to describe the variables of the physical problem in its original setting. This makes the approach ideal when the number of variables of the physical problem is not much greater than . In this work, we…
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Taxonomy
TopicsNon-Destructive Testing Techniques · Integrated Circuits and Semiconductor Failure Analysis · Surface and Thin Film Phenomena
