Band gaps of long-period polytypes of IV, IV-IV, and III-V semiconductors estimated with an Ising-type additivity model
Raghunathan Ramakrishnan, Shruti Jain

TL;DR
This study develops an Ising-type model to accurately estimate band gaps of various polytypes in IV, IV-IV, and III-V semiconductors, enabling predictions for complex structures where first-principles calculations are difficult.
Contribution
The paper introduces a novel additivity model that predicts band gaps of long-period polytypes with high accuracy, extending beyond computationally intensive first-principles methods.
Findings
Four models estimate band gaps with less than 0.05 eV error.
Predicted wide band gap (>3.4 eV) for a new SiC polytype 15R(1).
Identified metastable 15R(1)-SiC through stability analysis.
Abstract
We apply an Ising-type model to estimate the band gaps of the polytypes of group IV elements (C, Si, and Ge) and binary compounds of groups: IV-IV (SiC, GeC, and GeSi), and III-V (nitride, phosphide, and arsenide of B, Al, and Ga). The models use reference band gaps of the simplest polytypes comprising 2--6 bilayers calculated with the hybrid density functional approximation, HSE06. We report four models capable of estimating band gaps of nine polytypes containing 7 and 8 bilayers with an average error of eV. We apply the best model with an error of eV to predict the band gaps of 497 polytypes with up to 15 bilayers in the unit cell, providing a comprehensive view of the variation in the electronic structure with the degree of hexagonality of the crystal structure. Within our enumeration, we identify four rhombohedral polytypes of SiC -- 9, 12, 15(1), and…
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Taxonomy
TopicsSemiconductor materials and devices · Surface and Thin Film Phenomena · Semiconductor materials and interfaces
