Microwave characterization of tantalum superconducting resonators on silicon substrate with niobium buffer layer
Yoshiro Urade, Kay Yakushiji, Manabu Tsujimoto, Takahiro Yamada,, Kazumasa Makise, Wataru Mizubayashi, and Kunihiro Inomata

TL;DR
This study demonstrates that adding a niobium buffer layer improves the quality and superconducting properties of tantalum thin films on silicon, leading to high-Q microwave resonators suitable for quantum electronics.
Contribution
It introduces a method to grow high-quality tantalum films with enhanced microwave resonator performance using a niobium buffer layer on silicon substrates.
Findings
Internal quality factor approaches 2×10^7 at high photon numbers
TLS loss primarily caused by amorphous silicon at the interface
Quality factor increases below 200 mK, indicating TLS interactions
Abstract
Tantalum thin films sputtered on unheated silicon substrates are characterized with microwaves at around 10 GHz in a 10 mK environment. We show that the phase of tantalum with a body-centered cubic lattice (-Ta) can be grown selectively by depositing a niobium buffer layer prior to a tantalum film. The physical properties of the films, such as superconducting transition temperature and crystallinity, change markedly with the addition of the buffer layer. Coplanar waveguide resonators based on the composite film exhibit significantly enhanced internal quality factors compared with a film without the buffer layer. The internal quality factor approaches at a large-photon-number limit. While the quality factor decreases at the single-photon level owing to two-level system (TLS) loss, we have identified the primary cause of TLS loss to be the amorphous silicon layer at…
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Taxonomy
TopicsPhysics of Superconductivity and Magnetism · Photonic and Optical Devices · Advanced Frequency and Time Standards
