Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors

TL;DR

This paper introduces a multi-exposure fusion technique for diffraction patterns captured with direct electron detectors, significantly extending the angular range and improving analysis of nano-structured materials in SEM.

Contribution

It presents a novel multi-exposure fusion method that enhances wide-angle transmission Kikuchi diffraction patterns using a Timepix3 detector, enabling more comprehensive structural analysis.

Findings

Extended the dynamic range of diffraction patterns to over 95 degrees

Enabled normalization of intensity distribution across wide-angle patterns

Demonstrated rapid structural probing of nano-structured materials

Abstract

Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials typically diffraction pattern analysis is performed in the transmission electron microscope (TEM) and TEM diffraction patterns typically have a limited angular range (less than a few degrees) due to the long camera length, and this requires analysis of multiple patterns to probe a unit cell. As a different approach, wide angle Kikuchi patterns can be captured using an on-axis detector in the scanning electron microscope (SEM) with a shorter camera length. These 'transmission Kikuchi diffraction' (TKD) patterns present a direct projection of the unit cell and can be routinely analyzed using EBSD-based methods and dynamical diffraction theory. In the present work, we enhance this analysis significantly and present a multi-exposure diffraction pattern fusion method that increases the dynamic range of the detected patterns captured with a Timepix3-based direct electron detector (DED). This method uses an easy-to-apply exposure fusion routine to collect data and extend the dynamic range, as well as normalize the intensity distribution within these very wide (>95{\deg}) angle patterns. The potential of this method is demonstrated with full diffraction sphere reprojection and highlight potential of the approach to rapidly probe the structure of nano-structured materials in the scanning electron microscope.