Coherent X-ray Spectroscopy Elucidates Nanoscale Dynamics of Plasma-Enhanced Thin-Film Growth
Peco Myint, Jeffrey M. Woodward, Chenyu Wang, Xiaozhi Zhang, Lutz, Wiegart, Andrei Fluerasu, Randall L. Headrick, Charles R. Eddy, Jr., and Karl, F. Ludwig

TL;DR
This study uses advanced X-ray spectroscopy to observe nanoscale surface dynamics during plasma-enhanced thin film growth, revealing complex evolution patterns influenced by plasma and cyclic growth processes.
Contribution
It introduces real-time XPCS analysis to understand nanoscale surface evolution during plasma-enhanced atomic layer deposition, highlighting dynamic surface state transitions.
Findings
Sudden stress-relief events during initial growth
Surface morphology becomes long-lived after film continuity
Cyclic surface correlations linked to growth process
Abstract
Sophisticated thin film growth techniques increasingly rely on the addition of a plasma component to open or widen a processing window, particularly at low temperatures. However, the addition of the plasma into the growth environment also complicates the surface dynamical evolution. Taking advantage of continued increases in accelerator-based X-ray source brilliance, this real-time study uses X-ray Photon Correlation Spectroscopy (XPCS) to elucidate the nanoscale surface dynamics during Plasma-Enhanced Atomic Layer Deposition (PE-ALD) of an epitaxial indium nitride film. XPCS examines the evolution of the coherent X-ray scattering speckle pattern, which is a fingerprint of the unique sample microstructure at each moment in time. In PE-ALD, ultrathin films are synthesized from repeated cycles of alternating self-limited surface reactions induced by temporally-separated pulses of material…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · X-ray Spectroscopy and Fluorescence Analysis · Diamond and Carbon-based Materials Research
