Bayesian model calibration for diblock copolymer thin film self-assembly using power spectrum of microscopy data and machine learning surrogate
Lianghao Cao, Keyi Wu, J. Tinsley Oden, Peng Chen, Omar Ghattas

TL;DR
This paper introduces a Bayesian calibration method for diblock copolymer thin film self-assembly models, utilizing power spectrum analysis and machine learning surrogates to improve parameter inference and computational efficiency.
Contribution
It develops a novel AAPS-based Bayesian calibration framework with phase-informed priors and neural network surrogates for efficient model parameter estimation.
Findings
AAPS retains key information on pattern length scales.
The neural network surrogate reduces simulation needs fivefold.
The method effectively calibrates models with uncertain data.
Abstract
Identifying parameters of computational models from experimental data, or model calibration, is fundamental for assessing and improving the predictability and reliability of computer simulations. In this work, we propose a method for Bayesian calibration of models that predict morphological patterns of diblock copolymer (Di-BCP) thin film self-assembly while accounting for various sources of uncertainties in pattern formation and data acquisition. This method extracts the azimuthally-averaged power spectrum (AAPS) of the top-down microscopy characterization of Di-BCP thin film patterns as summary statistics for Bayesian inference of model parameters via the pseudo-marginal method. We derive the analytical and approximate form of a conditional likelihood for the AAPS of image data. We demonstrate that AAPS-based image data reduction retains the mutual information, particularly on…
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Taxonomy
TopicsBlock Copolymer Self-Assembly · Model Reduction and Neural Networks · Machine Learning in Materials Science
