Unraveling the interlayer and intralayer coupling in two-dimensional layered MoS$_2$ by X-ray absorption spectroscopy and ab initio molecular dynamics simulations
Inga Pudza, Dmitry Bocharov, Andris Anspoks, Matthias Krack, Aleksandr, Kalinko, Edmund Welter, Alexei Kuzmin

TL;DR
This study combines X-ray absorption spectroscopy with advanced simulations to quantify interlayer and intralayer coupling in 2D MoS₂, revealing anisotropic thermal vibrations and interaction strengths across a wide temperature range.
Contribution
It introduces a novel integrated approach using RMC and AIMD simulations with EXAFS data to quantify weak interlayer and intralayer interactions in 2D layered materials.
Findings
Quantified interlayer and intralayer force constants in MoS₂.
Demonstrated anisotropic thermal vibrations within the layers.
Validated high-temperature simulations with experimental data.
Abstract
Understanding interlayer and intralayer coupling in two-dimensional layered materials (2DLMs) has fundamental and technological importance for their large-scale production, engineering heterostructures, and development of flexible and transparent electronics. At the same time, the quantification of weak interlayer interactions in 2DMLs is a challenging task, especially, from the experimental point of view. Herein, we demonstrate that the use of X-ray absorption spectroscopy in combination with reverse Monte Carlo (RMC) and ab initio molecular dynamics (AIMD) simulations can provide useful information on both interlayer and intralayer coupling in 2DLM 2H-MoS. The analysis of the low-temperature (10-300 K) Mo K-edge extended X-ray absorption fine structure (EXAFS) using RMC simulations allows for obtaining information on the means-squared relative displacements for…
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Taxonomy
Topics2D Materials and Applications · Machine Learning in Materials Science · Chalcogenide Semiconductor Thin Films
