A Distributed Conductance Tester Without Global Information Collection
Tugkan Batu, Amitabh Trehan, Chhaya Trehan

TL;DR
This paper introduces a time-optimal distributed algorithm for testing graph conductance in the CONGEST model, using multiple short random walks without global information aggregation, improving robustness and efficiency.
Contribution
The paper presents a novel, simple, and optimal-time distributed conductance testing algorithm that avoids global aggregation, leveraging spectral graph theory and random walks.
Findings
Runs in O(log n) rounds, proven optimal
Uses multiple short random walks from random sources
Eliminates need for global aggregation techniques
Abstract
We propose a simple and time-optimal algorithm for property testing a graph for its conductance in the CONGEST model. Our algorithm takes only rounds of communication (which is known to be optimal), and consists of simply running multiple random walks of length from a certain number of random sources, at the end of which nodes can decide if the underlying network is a good conductor or far from it. Unlike previous algorithms, no aggregation is required even with a smaller number of walks. Our main technical contribution involves a tight analysis of this process for which we use spectral graph theory. We introduce and leverage the concept of sticky vertices which are vertices in a graph with low conductance such that short random walks originating from these vertices end in a region around them. The present state-of-the-art distributed CONGEST algorithm for the…
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Taxonomy
TopicsVLSI and Analog Circuit Testing
