EVREAL: Towards a Comprehensive Benchmark and Analysis Suite for Event-based Video Reconstruction
Burak Ercan, Onur Eker, Aykut Erdem, Erkut Erdem

TL;DR
This paper introduces EVREAL, a comprehensive benchmark and analysis suite for evaluating event-based video reconstruction methods, providing standardized protocols, diverse datasets, and detailed performance insights.
Contribution
The paper presents EVREAL, an open-source framework that standardizes evaluation and enables detailed comparison of state-of-the-art event-based video reconstruction techniques.
Findings
EVREAL facilitates fair comparison of methods.
Analysis reveals strengths and weaknesses of current approaches.
Performance varies significantly across different scenarios.
Abstract
Event cameras are a new type of vision sensor that incorporates asynchronous and independent pixels, offering advantages over traditional frame-based cameras such as high dynamic range and minimal motion blur. However, their output is not easily understandable by humans, making the reconstruction of intensity images from event streams a fundamental task in event-based vision. While recent deep learning-based methods have shown promise in video reconstruction from events, this problem is not completely solved yet. To facilitate comparison between different approaches, standardized evaluation protocols and diverse test datasets are essential. This paper proposes a unified evaluation methodology and introduces an open-source framework called EVREAL to comprehensively benchmark and analyze various event-based video reconstruction methods from the literature. Using EVREAL, we give a detailed…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Code & Models
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Memory and Neural Computing · Advanced MRI Techniques and Applications · Semiconductor materials and devices
MethodsTest
