Using Electron Energy-Loss Spectroscopy to Measure Nanoscale Electronic and Vibrational Dynamics in a TEM
Ye-Jin Kim, Levi D. Palmer, Wonseok Lee, Nicholas J. Heller, and Scott, K. Cushing

TL;DR
This paper reviews high-resolution electron energy-loss spectroscopy (EELS) in TEMs, highlighting recent advances and proposing ultrafast EELS as a next step for atomic-scale, time-resolved electronic and vibrational measurements.
Contribution
It introduces the concept of ultrafast EELS in TEMs, combining atomic resolution with temporal dynamics to explore excited state phenomena.
Findings
Recent advances enable low-loss and core-loss EELS at atomic resolution.
Ultrafast EELS can capture time-resolved electronic and vibrational dynamics.
Potential integration with in situ and cryo techniques expands application scope.
Abstract
Electron energy-loss spectroscopy (EELS) can measure similar information to X-ray, UV-Vis, and IR spectroscopies but with atomic resolution and increased scattering cross sections. Recent advances in electron monochromators have expanded EELS capabilities from chemical identification to the realms of synchrotron-level core-loss measurements and to low-loss, 10-100 meV excitations such as phonons, excitons, and valence structure. EELS measurements are easily correlated with electron diffraction and atomic-scale real-space imaging in a transmission electron microscope (TEM) to provide detailed local pictures of quasiparticle and bonding states. This perspective provides an overview of existing high-resolution EELS (HR-EELS) capabilities while also motivating the powerful next step in the field - ultrafast EELS in a TEM. Ultrafast EELS aims to combine atomic level, element specific, and…
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Taxonomy
TopicsElectron and X-Ray Spectroscopy Techniques · Advanced Electron Microscopy Techniques and Applications · X-ray Spectroscopy and Fluorescence Analysis
