A platform for in situ synthesis in a STEM
Ondrej Dyck, Andrew R. Lupini, Stephen Jesse

TL;DR
This paper introduces an in situ thermal deposition platform for STEM that enables atomic-scale material synthesis and manipulation, advancing quantum material engineering through real-time atomic resolution imaging.
Contribution
The paper presents a novel in situ thermal deposition platform for STEM, demonstrating atomized material delivery and enabling atomic-scale synthesis and growth processes.
Findings
Isolated Sn atoms successfully evaporated and captured on samples.
The platform allows real-time atomic resolution imaging of growth processes.
Potential for atomic fabrication and defect engineering in quantum materials.
Abstract
The engineering of quantum materials requires the development of tools able to address various synthesis and characterization challenges. These include the establishment and refinement of growth methods, material manipulation, and defect engineering. Material modification at the atomic level will be a key enabling factor for the engineering of quantum materials where desired phenomena are critically determined by local atomic structures. Successful use of scanning transmission electron microscopes (STEMs) for atomic scale material manipulation has opened the door for a transformed view of what can be accomplished using electron-beam-based strategies. However, serious obstacles exist on the pathway from possibility to practical reality. One such obstacle is the in situ delivery of atomized material in the STEM to the region of interest for further fabrication processes. Here, we present…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · Advanced Materials Characterization Techniques
