# Scanning qubit probe of edge states in a topological insulator

## TL;DR

This paper introduces a qubit-based sensor that characterizes topological edge states in low-dimensional systems by analyzing qubit decoherence, enabling spatial mapping of edge states in a topological insulator model.

## Contribution

A novel qubit probe method is developed to detect and spatially characterize topological edge states through decoherence measurements.

## Key findings

- Successfully identifies topological edge states
- Provides a complete spatial profile of edge states
- Analytical decoherence rate expression derived

## Abstract

In this work, we propose a novel qubit-based sensor with the ability to characterize topological edge states in low-dimensional systems. A composite system is studied, consisting of a qubit coupled to a topologically nontrivial Su-Schrieffer-Heeger chain between semi-infinite lead channels. This qubit probe utilizes decoherence dynamics which, under a weak-coupling framework, are related to the environment's local density of states. Qubit decoherence rate measurements along a sample therefore provide the means to extract edge state profiles. The environment's influence on the qubit's subspace is captured by an effective projective treatment, leading to an analytical decoherence rate expression. We demonstrate that the scanning qubit probe identifies and yields a complete spatial characterization of the topological edge states within the composite system.