Midgap state requirements for optically active quantum defects
Yihuang Xiong, Milena Mathew, Sin\'ead M. Griffin, Alp Sipahigil,, Geoffroy Hautier

TL;DR
This paper challenges the traditional view that only deep-level quantum defects are useful for quantum technologies, showing that defects near band edges can also be optically active and useful.
Contribution
It broadens the understanding of quantum defect electronic structures, highlighting defects near band edges as viable for quantum applications, and discusses implications for defect design and discovery.
Findings
Defects near band edges can be optically active.
Transitions involving band-like levels are relevant for quantum defects.
Loosening electronic structure requirements enables new defect discovery.
Abstract
Optically active quantum defects play an important role in quantum sensing, computing, and communication. The electronic structure and the single-particle energy levels of these quantum defects in the semiconducting host have been used to understand their opto-electronic properties. Optical excitations that are central for their initialization and readout are linked to transitions between occupied and unoccupied single-particle states. It is commonly assumed that only quantum defects introducing levels well within the band gap and far from the band edges are of interest for quantum technologies as they mimic an isolated atom embedded in the host. In this perspective, we contradict this common assumption and show that optically active defects with energy levels close to the band edges can display similar properties. We highlight quantum defects that are excited through transitions to or…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsDiamond and Carbon-based Materials Research · Integrated Circuits and Semiconductor Failure Analysis · Advanced Surface Polishing Techniques
