Optimizing YOLOv7 for Semiconductor Defect Detection
Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

TL;DR
This paper improves semiconductor defect detection by optimizing YOLOv7 hyperparameters and ensembling strategies, achieving a 10% increase in mean Average Precision over the default model.
Contribution
It systematically evaluates hyperparameters and ensembling methods for YOLOv7, demonstrating significant performance gains in semiconductor defect detection.
Findings
Random vertical flipping improves AP by 3%.
Ensembling with Weighted Box Fusion enhances mAP by 10%.
Default YOLOv7 outperforms previous RetinaNet models.
Abstract
The field of object detection using Deep Learning (DL) is constantly evolving with many new techniques and models being proposed. YOLOv7 is a state-of-the-art object detector based on the YOLO family of models which have become popular for industrial applications. One such possible application domain can be semiconductor defect inspection. The performance of any machine learning model depends on its hyperparameters. Furthermore, combining predictions of one or more models in different ways can also affect performance. In this research, we experiment with YOLOv7, a recently proposed, state-of-the-art object detector, by training and evaluating models with different hyperparameters to investigate which ones improve performance in terms of detection precision for semiconductor line space pattern defects. The base YOLOv7 model with default hyperparameters and Non Maximum Suppression (NMS)…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Advanced Neural Network Applications · COVID-19 diagnosis using AI
Methods1x1 Convolution · Convolution · Feature Pyramid Network · Balanced Selection · Non Maximum Suppression · Focal Loss · Network On Network · RetinaNet
