Probing magnetic properties at the nanoscale: In-situ Hall measurements in a TEM
Darius Pohl, Yejin Lee, Dominik Kriegner, Sebastian Beckert, Sebastian, Schneider, Bernd Rellinghaus, Andy Thomas

TL;DR
This paper introduces an in-situ Hall measurement technique within a transmission electron microscope, enabling simultaneous magnetic imaging and structural analysis to better understand complex magnetic textures at the nanoscale.
Contribution
It presents a novel in-situ magneto-transport measurement method in TEM, combining magnetic imaging with structural characterization for detailed analysis of magnetic properties.
Findings
Successful proof-of-principle measurements on nickel thin films
Highlighting the importance of detailed structural knowledge for interpreting magneto-transport data
Potential to improve understanding of complex magnetic textures
Abstract
We report on advanced in-situ magneto-transport measurements in a transmission electron microscope. The approach allows for concurrent magnetic imaging and high resolution structural and chemical characterization of the same sample. Proof-of-principle in-situ Hall measurements on presumably undemanding nickel thin films supported by micromagnetic simulations reveal that in samples with non-trivial structures and/or compositions, detailed knowledge of the latter is indispensable for a thorough understanding and reliable interpretation of the magneto-transport data. The proposed in-situ approach is thus expected to contribute to a better understanding of the Hall signatures in more complex magnetic textures.
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Taxonomy
TopicsMagnetic properties of thin films · Surface and Thin Film Phenomena · Quantum and electron transport phenomena
