Transport properties of a 1000-nm HgTe film: the interplay of surface and bulk carriers
M. L. Savchenko, D. A. Kozlov, N. N. Mikhailov, S. A. Dvoretsky, and, Z. D. Kvon

TL;DR
This study investigates the transport properties of a thick HgTe film, revealing the coexistence of surface and bulk states, tunable carrier types, high mobility, and complex quantum oscillation patterns, contributing to understanding topological and bulk electronic behaviors.
Contribution
It provides the first detailed analysis of transport in a fully relaxed, thick HgTe film, demonstrating the coexistence of surface and bulk states and their influence on quantum transport phenomena.
Findings
Tunable transition from electron to hole transport via gate voltage
High electron mobility exceeding 300,000 cm²/Vs
Observation of multiple SdH oscillation frequencies linked to different states
Abstract
We report on systematic study of transport properties of a 1000-nm HgTe film. Unlike to thinner and strained HgTe films, which are known as high-quality three-dimensional (3D) topological insulators, the film under study is much thicker than the limit of pseudomorphic growth of HgTe on a CdTe substrate. Therefore, it is expected to be fully relaxed and has the band structure of bulk HgTe, i.e., a zero gap semiconductor. Nevertheless, since the bands inversion the two-dimensional (2D) topological surface states are still expected to exist. To check this claim we studied classical and quantum transport response of the system. We demonstrate that by tuning the top-gate voltage one can change the electron-dominating transport to the hole one. The highest electron mobility is found to be more than cm/Vs. The system exhibits Shubnikov-de Haas (SdH) oscillations with a…
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Taxonomy
TopicsTopological Materials and Phenomena · Diamond and Carbon-based Materials Research · Surface and Thin Film Phenomena
