Bandgap fluctuations and robustness in two-dimensional hyperuniform dielectric materials

TL;DR

This study investigates how photonic band gaps fluctuate and how robust they are in two-dimensional hyperuniform disordered dielectric materials, revealing how correlations influence gap size and overlap.

Contribution

It provides new insights into the statistical behavior of band gaps in hyperuniform disordered systems and identifies a critical stealthiness value affecting gap robustness.

Findings

Band gaps are narrow and non-overlapping at low stealthiness.

Above a critical stealthiness, band gaps become large and overlap.

A second photonic bandgap appears at higher stealthiness.

Abstract

We numerically study the statistical fluctuations of photonic band gaps in ensembles of stealthy hyperuniform disordered patterns. We find that at low stealthiness, where correlations are weak, band gaps of different system realizations appear over a wide frequency range, are narrow, and generally do not overlap. Interestingly, above a critical value of stealthiness $\chi \gtrsim 0.35$, the bandgaps become large and overlap significantly from realization to realization, while a second gap appears. These observations extend our understanding of photonic bandgaps in disordered systems and provide information on the robustness of gaps in practical applications.