Growth of $\alpha-Ga_2O_3$ on $Al_2O_3$ by conventional molecular-beam epitaxy and metal-oxide-catalyzed epitaxy
J. P. McCandless, D. Rowe, N. Pieczulewski, V. Protasenko, M., Alonso-Orts, M. S. Williams, M. Eickhoff, H. G. Xing, D. A. Muller, D. Jena,, P. Vogt

TL;DR
This paper demonstrates improved growth of $ ext{Ga}_2 ext{O}_3$ on $ ext{Al}_2 ext{O}_3$ using both conventional MBE and In-mediated MOCATAXY, achieving higher growth rates and better film quality.
Contribution
It introduces a growth-rate diagram for $ ext{Ga}_2 ext{O}_3$ and shows how MOCATAXY enhances growth rate, window, and film quality compared to conventional methods.
Findings
In-mediated catalysis increases growth rate and reduces mosaic spread.
Growth rates over 0.2 μm/hr achieved with MOCATAXY.
Faceting observed and analyzed via electron microscopy.
Abstract
We report the growth of on -plane by conventional plasma-assisted molecular-beam epitaxy (MBE) and In-mediated metal-oxide-catalyzed epitaxy (MOCATAXY). We report a growth-rate-diagram for (10-10), and observe (i) a growth rate increase, (ii) an expanded growth window, and (iii) reduced out-of-lane mosaic spread when MOCATAXY is employed for the growth of . Through the use of In-mediated catalysis, growth rates over and rocking curves with full width at half maxima of are achieved. Faceting is observed along the film surface and is explored through scanning transmission electron microscopy.
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Taxonomy
TopicsGa2O3 and related materials · Semiconductor materials and devices · GaN-based semiconductor devices and materials
