Development of a Laser-based angle-resolved-photoemission spectrometer with sub-micrometer spatial resolution and high-efficiency spin detection
R. Z. Xu, X. Gu, W. X. Zhao, J. S. Zhou, Q. Q. Zhang, X. Du, Y. D. Li,, Y. H. Mao, D. Zhao, K. Huang, C. F. Zhang, F. Wang, Z. K. Liu, Y. L. Chen,, and L. X. Yang

TL;DR
This paper introduces a laser-based angle-resolved photoemission spectrometer with sub-micrometer spatial resolution and high-efficiency spin detection, enabling detailed study of quantum materials with improved convenience and flux compared to synchrotron-based systems.
Contribution
The development of a lab-based LMS-ARPES system with sub-micron resolution, high photon flux, and integrated spin detection is a novel advancement in quantum material analysis tools.
Findings
Confirmed sub-micron spatial resolution of the system.
Demonstrated high spin-polarization in Bi2Se3 topological insulator.
System enables high-resolution, high-statistics measurements in condensed matter research.
Abstract
Angle-resolved photoemission spectroscopy with sub-micrometer spatial resolution ({\mu}-ARPES), has become a powerful tool for studying quantum materials. To achieve sub-micrometer or even nanometer-scale spatial resolution, it is important to focus the incident light beam (usually from the synchrotron radiation) using X-ray optics such as the zone plate or ellipsoidal capillary mirrors. Recently, we developed a laser-based {\mu}-ARPES with spin-resolution (LMS-ARPES). The 177 nm laser beam is achieved by frequency doubling a 355 nm beam using a KBBF crystal and subsequently focused using an optical lens with a focal length of about 16 mm. By characterizing the focused spot size using different methods and performing spatial-scanning photoemission measurement, we confirm the sub-micron spatial resolution of the system. Compared with the {\mu}-ARPES facilities based on synchrotron…
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Taxonomy
TopicsPhotocathodes and Microchannel Plates · Electron and X-Ray Spectroscopy Techniques · Advanced X-ray Imaging Techniques
