Long Rayleigh length confocal microscope: A fast evaluation tool for obtaining quantum properties of color centers

TL;DR

This paper introduces a long Rayleigh length confocal microscope that enables rapid, wide-area evaluation of quantum properties of color centers in semiconductors, facilitating scalable quantum sensing device development.

Contribution

The paper presents a novel confocal microscope system with a long Rayleigh length that improves speed and area coverage for characterizing color centers.

Findings

Faster evaluation over wider areas compared to traditional microscopes

Effective characterization of quantum properties of color centers

Potential for scalable quantum sensing device development

Abstract

Color centers in wide band-gap semiconductors, which have superior quantum properties even at room temperature and atmospheric pressure, have been actively applied to quantum sensing devices. Characterization of the quantum properties of the color centers in the semiconductor materials and ensuring that these properties are uniform over a wide area are key issues for developing quantum sensing devices based on color center. In this article, we will describe the principle and performance of a newly developed confocal microscope system with a long Rayleigh length (LRCFM). This system can characterize a wider area faster than the confocal microscope systems commonly used for color center evaluation.