3D-imaging of Printed Nanostructured Networks using High-resolution FIB-SEM Nanotomography

TL;DR

This paper demonstrates the use of high-resolution FIB-SEM nanotomography to quantitatively analyze the 3D morphology of printed nanostructured networks, linking structure to electrical properties and enabling device optimization.

Contribution

It introduces a novel application of FIB-SEM nanotomography for detailed 3D characterization of nanostructured networks in printed electronics.

Findings

Nanostructured networks exhibit specific morphological features linked to resistivity.

FIB-SEM nanotomography provides detailed 3D images at nanometer resolution.

The technique can be extended to analyze interfaces in heterostructures.

Abstract

Networks of solution-processed nanomaterials are important for multiple applications in electronics, sensing and energy storage/generation. While it is known that network morphology plays a dominant role in determining the physical properties of printed networks, it remains difficult to quantify network structure. Here, we utilise FIB-SEM nanotomography to characterise the morphology of nanostructured networks. Nanometer-resolution 3D-images were obtained from printed networks of graphene nanosheets of various sizes, as well as networks of WS2 nanosheets, silver nanosheets and silver nanowires. Important morphological characteristics, including network porosity, tortuosity, pore dimensions and nanosheet orientation were extracted and linked to network resistivity. By extending this technique to interrogate the structure and interfaces within vertical printed heterostacks, we demonstrate the potential of this technique for device characterisation and optimisation.