Comparing Methods of Characterizing Energetic Disorder in Organic Solar Cells

TL;DR

This paper compares various methods for characterizing energetic disorder in organic solar cells, revealing that different techniques probe different energy ranges and have specific limitations, which explains discrepancies in measurements.

Contribution

The study systematically analyzes and compares multiple characterization techniques, highlighting their differences and limitations in measuring energetic disorder in organic semiconductors.

Findings

Electrical measurements often show higher energetic disorder than optical methods.

Different techniques probe distinct energy ranges of the density of states.

Series resistance can hinder extraction of information from capacitance-voltage measurements.

Abstract

Energetic disorder has been known for decades to limit the performance of structurally disordered semiconductors such as amorphous silicon and organic semiconductors. However, in the past years, high performance organic solar cells have emerged showing a continuously reduced amount of energetic disorder. While searching for future high efficiency material systems, it is therefore important to correctly characterize this energetic disorder. While there are several techniques in literature, the most common approaches to probe the density of defect states are using optical excitation as in external quantum efficiency measurements or sequential filling of the tail states by applying an external voltage as in admittance spectroscopy. A metanalysis of available literature as well as our experiments using four characterization techniques on two material systems reveal that electrical, voltage-dependent measurements frequently yield higher values of energetic disorder than optical measurements. With drift-diffusion simulations, we demonstrate that the approaches probe different energy ranges of the subband-gap density of states. We further explore the limitations of the techniques and find that extraction of information from a capacitance-voltage curve can be inhibited by an internal series resistance. Thereby, we explain the discrepancies between measurements techniques with sensitivity to different energy ranges and electronic parameters.