Random Telegraph Noise based True Random Number Generator for Fully Integrated Systems

TL;DR

This paper presents a fully integrated, power-efficient true random number generator using MOSFET-based random telegraph noise, which passes NIST tests without additional post-processing, suitable for embedded systems.

Contribution

It introduces a novel, lightweight, fully integrated TRNG design leveraging RTN in MOSFETs, eliminating the need for complex analog circuitry and post-processing.

Findings

The proposed TRNG passes NIST randomness tests.

It is area and power efficient for embedded applications.

No traditional post-processing required.

Abstract

Generating streams of true random numbers is a critical component of many embedded systems. The design of fully integrated, area and power efficient True Random Number Generators is a challenge. We propose a fully integrated, lightweight implementation, that uses the random telegraph noise (RTN) of standard MOSFET as entropy source. It is not analog-intensive, and without traditional post-processing algorithms, the generated random bit sequence passes the National Institute of Standards and Technology (NIST) tests.