Microstructuring YbRh2Si2 for resistance and noise measurements down to ultra-low temperatures
Alexander Steppke, Sandra Hamann, Markus K\"onig, Andrew P. Mackenzie,, Kristin Kliemt, Cornelius Krellner, Marvin Kopp, Martin Lonsky, Jens, M\"uller, Lev V. Levitin, John Saunders, Manuel Brando

TL;DR
This paper demonstrates that microstructuring YbRh2Si2 using focused-ion-beam techniques enables ultra-low temperature measurements, improved signal-to-noise ratios, and detailed studies of quantum phase transitions and superconductivity.
Contribution
The study introduces microstructuring as a novel approach to enhance low-temperature electrical and noise measurements in highly conductive correlated metals.
Findings
Achieved ultra-low temperature measurements down to 0.95 mK.
Observed sharp phase transitions and new SdH frequencies.
Enhanced signal-to-noise ratio enabling resistance fluctuation spectroscopy.
Abstract
The discovery of superconductivity in the quantum critical Kondo-lattice system YbRh2Si2 at an extremely low temperature of 2 mK has inspired efforts to perform high-resolution electrical resistivity measurements down to this temperature range in highly conductive materials. Here we show that control over the sample geometry by microstructuring using focused-ion-beam (FIB) techniques allows to reach ultra-low temperatures and increase signal-to-noise ratios (SNR) tenfold, without adverse effects to sample quality. In five experiments we show four-terminal sensing resistance and magnetoresistance measurements which exhibit sharp phase transitions at the N\'eel temperature, and Shubnikov-de-Haas (SdH) oscillations between 13 T and 18 T where we identified a new SdH frequency of 0.39 kT. The increased SNR allowed resistance fluctuation (noise) spectroscopy that would not be possible for…
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