Monolithically Integrated Wavelength-meter in InP with measurement bandwidth of 100nm centered on the C band

TL;DR

This paper presents a monolithically integrated InP wavelength meter based on ring resonators, capable of measuring over 100nm bandwidth with high resolution and fast measurement speed, suitable for integration with active photonic components.

Contribution

It demonstrates a monolithic InP wavelength meter with a broad 100nm bandwidth, high resolution, and rapid measurement speed, fabricated via a commercial MPW process.

Findings

Achieved measurement bandwidth of 100nm centered on the C band.

The device can theoretically resolve down to 1.6pm.

Measurement speed is demonstrated at 500ps.

Abstract

In this paper we will explore the creation of a monolithically integrated wavelength meter in InP. This type of devices are a key requirement for many applications and it is especially important to have them integrated with active components like lasers and gain sections. We present a wavelength meter based on multiple ring resonators that has been realized in a commercial MPW run and tested using a tunable laser. The designed circuit is theoretically capable of resolution down to 1.6pm and a measurement speed down to 500ps within a wavelength range of 100nm.