High-precision FoM measurement setup for Ti:Sapphire crystals

TL;DR

This paper introduces a high-precision measurement setup for the figure of merit (FoM) of Ti:Sapphire crystals, achieving significantly improved accuracy over commercial spectrometers and enabling detailed analysis of crystal inhomogeneities.

Contribution

The paper presents a novel high-precision transmission measurement setup that significantly enhances FoM measurement accuracy for Ti:Sapphire crystals.

Findings

Achieved FoM measurement precision of 7.5% (3-sigma)

Detected spatial inhomogeneities in a commercial Ti:Sa crystal

Showed FoM is affected by crystal inhomogeneities and angular mismatch

Abstract

The figure of merit (FoM) of Ti:Sapphire (Ti:Sa) crystals is a generally used means to evaluate the quality of the crystals. Despite the importance of Ti:Sa, the question of FoM measurement precision stayed out of focus, while the commercially available spectrometers provide unsatisfactory 3-sigma precision reaching 60 %. In this paper, we present a setup for a single-pass high-precision transmission measurement for three different wavelengths (532 nm, 780 nm, and 1560 nm) based on Nd:YAG and Er:YAG lasers. A synchronous detection via a double integrated sphere enabled us to achieve the transmission uncertainty of 0,01-0,03%. With the presented setup, we show that it is possible to determine the FoM values with 3-sigma precision of 7,5 %. Owing to the high FoM precision, we were able to trace spatial inhomogeneities of an unannealed Ti:Sa crystal produced by a commercial manufacturer Crytur. Our measurements demonstrate that the FoM values can be significantly affected by the crystal inhomogeneities and angular mismatch between the c-axis of the Ti:Sa and polarization orientation.