A Bayesian Framework for Automated Debugging
Sungmin Kang, Wonkeun Choi, Shin Yoo

TL;DR
This paper introduces a Bayesian framework for understanding automated debugging, enabling formal analysis of techniques like fault localization and program repair, and demonstrates its effectiveness through a new patch prioritization method that improves accuracy and efficiency.
Contribution
It presents the first theoretical Bayesian framework for automated debugging, unifying and analyzing existing techniques, and proposes BAPP, a value-aware patch prioritization method that enhances debugging performance.
Findings
BAPP reduces patch validation by 68%.
BAPP decreases repair time by 34 minutes on average.
BAPP increases fault localization accuracy from 8 to 11 at@5.
Abstract
Debugging takes up a significant portion of developer time. As a result, automated debugging techniques including Fault Localization (FL) and Automated Program Repair (APR) have garnered significant attention due to their potential to aid developers in debugging tasks. Despite intensive research on these subjects, we are unaware of a theoretic framework that highlights the principles behind automated debugging and allows abstract analysis of techniques. Such a framework would heighten our understanding of the endeavor and provide a way to formally analyze techniques and approaches. To this end, we first propose a Bayesian framework of understanding automated repair and find that in conjunction with a concrete statement of the objective of automated debugging, we can recover maximal fault localization formulae from prior work, as well as analyze existing APR techniques and their…
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Taxonomy
TopicsSoftware Engineering Research · Software Testing and Debugging Techniques · Software Reliability and Analysis Research
