A Lightweight Reconstruction Network for Surface Defect Inspection
Chao Hu, Jian Yao, Weijie Wu, Weibin Qiu, Liqiang Zhu

TL;DR
This paper introduces a lightweight unsupervised surface defect detection method using a convolutional autoencoder trained only on defect-free samples, effectively identifying irregular surface defects with high robustness and accuracy.
Contribution
It proposes a novel lightweight reconstruction network with a combined loss function for unsupervised defect detection, addressing scarcity of defect samples and irregular defect textures.
Findings
High detection accuracy on multiple defect datasets
Strong robustness against various defect types
Effective localization of surface defects
Abstract
Currently, most deep learning methods cannot solve the problem of scarcity of industrial product defect samples and significant differences in characteristics. This paper proposes an unsupervised defect detection algorithm based on a reconstruction network, which is realized using only a large number of easily obtained defect-free sample data. The network includes two parts: image reconstruction and surface defect area detection. The reconstruction network is designed through a fully convolutional autoencoder with a lightweight structure. Only a small number of normal samples are used for training so that the reconstruction network can be A defect-free reconstructed image is generated. A function combining structural loss and loss is proposed as the loss function of the reconstruction network to solve the problem of poor detection of irregular texture surface defects.…
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Taxonomy
TopicsIndustrial Vision Systems and Defect Detection · Integrated Circuits and Semiconductor Failure Analysis · Advanced Surface Polishing Techniques
