Silicon-doped $\beta$-Ga$_2$O$_3$ films grown at 1 $\mu$m/h by suboxide molecular-beam epitaxy
Kathy Azizie, Felix V. E. Hensling, Cameron A. Gorsak, Yunjo Kim,, Daniel M. Dryden, M. K. Indika Senevirathna, Selena Coye, Shun-Li Shang,, Jacob Steele, Patrick Vogt, Nicholas A. Parker, Yorick A. Birkh\"olzer,, Jonathan P. McCandless, Debdeep Jena, Huili G. Xing, Zi-Kui Liu

TL;DR
This paper demonstrates a rapid, controlled growth of high-quality silicon-doped $eta$-Ga$_2$O$_3$ films using suboxide molecular-beam epitaxy at 1 μm/h, enabling improved doping control and device fabrication.
Contribution
It introduces a novel S-MBE technique for fast, high-quality $eta$-Ga$_2$O$_3$ film growth with precise silicon doping control and demonstrates functional MESFET devices.
Findings
Achieved ~1 μm/h growth rate of $eta$-Ga$_2$O$_3$ films.
Controlled silicon doping from 5x10$^{16}$ to 10$^{19}$ cm$^{-3}$.
Demonstrated functional MESFETs from these films.
Abstract
We report the use of suboxide molecular-beam epitaxy (S-MBE) to grow -GaO at a growth rate of ~1 m/h with control of the silicon doping concentration from 5x10 to 10 cm. In S-MBE, pre-oxidized gallium in the form of a molecular beam that is 99.98\% GaO, i.e., gallium suboxide, is supplied. Directly supplying Ga2O to the growth surface bypasses the rate-limiting first step of the two-step reaction mechanism involved in the growth of -GaO by conventional MBE. As a result, a growth rate of ~1 m/h is readily achieved at a relatively low growth temperature (T = 525 C), resulting in films with high structural perfection and smooth surfaces (rms roughness of < 2 nm on ~1 m thick films). Silicon-containing oxide sources (SiO and SiO) producing an SiO suboxide molecular beam are used to dope the…
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Taxonomy
TopicsGa2O3 and related materials · Advanced Photocatalysis Techniques · Electronic and Structural Properties of Oxides
