Increased material differentiation through multi-contrast x-ray imaging: a preliminary evaluation of potential applications to the detection of threat materials
A. Astolfo, I.G. Haig, D. Bate, A. Olivo, P. Modregger

TL;DR
This study explores combining phase-based dark-field x-ray imaging with dual-energy methods to enhance material discrimination in security scans, showing preliminary improvements in identifying threat materials over traditional techniques.
Contribution
It introduces a novel multi-contrast x-ray imaging approach that integrates dark-field and attenuation images for improved threat material detection.
Findings
Enhanced contrast between threat and non-threat materials
Improved discrimination when combining multiple imaging channels
Potential for better detection of materials with similar densities
Abstract
Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well as electron density and its consequent classification as organic or inorganic. Recently phase-based "dark-field" x-ray imaging approaches have emerged that are sensitive to complementary features of a material, namely its unresolved microstructure. It can therefore be speculated that their inclusion in the security-based imaging could enhance material discrimination, for example of materials with similar electron densities and Z eff but different microstructures. In this paper, we present a preliminary evaluation of the advantages that such a combination could bear. Utilising an energy-resolved detector for a phase-based dark-field technique provides dual-energy attenuation and dark-field images simultaneously.…
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Taxonomy
TopicsAdvanced X-ray and CT Imaging · Advanced X-ray Imaging Techniques · X-ray Spectroscopy and Fluorescence Analysis
