Emergent grain boundary phases in stressed polycrystalline thin films
Mengyuan Wang, Ruilin Yan, Xiao Han, Hailong Wang, and Moneesh Upmanyu

TL;DR
This paper investigates how emergent grain boundary phases in stressed polycrystalline thin films adapt their structure and morphology in response to external strains, affecting surface phenomena and material properties.
Contribution
It introduces a combined continuum, numerical, and atomistic approach to reveal how eGB phases respond to stress and influence surface evolution in copper films.
Findings
eGB phases respond to external strains by morphological and rotational changes.
Stress influences eGB phase transitions, promoting different behaviors under tension and compression.
eGB phase transitions are linked to surface island formation and step flow dynamics.
Abstract
The grain boundary (GB) microstructure influences and is influenced by the development of residual stresses during synthesis of polycrystalline thin films. Recent studies have shown that the frustration between the preferred growth direction and rotations of abutting crystals to local cusps in GB energies leads to internal stresses localized within nanoscopic surface layers around the valleys and ridges that form at emergent boundaries (eGBs). Using a combination of continuum frameworks, numerical analyses and all-atom simulations of bicrystal copper films, we show that eGBs tune their surface morphology and rotation extent in response to external strains. Compression favors rotation to and growth of low energy GB phases (complexions) at eGB valleys while tension favors the transitions at eGB ridges, a reflection of the stress-induced mass efflux/influx that changes…
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Taxonomy
TopicsMicrostructure and mechanical properties · Metal and Thin Film Mechanics · Copper Interconnects and Reliability
