An Accessible Method for Simulating Charged-Particle Optics, with Examples for Transmission Electron Microscopy
Patrick McBean, Zachary Milne, Arjun Kanthawar, Cameron O'Byrne,, Khalid Hattar, Lewys Jones

TL;DR
This paper presents an accessible simulation method using COMSOL Multiphysics to model charged-particle optics in TEM, enabling rapid, cost-effective exploration of new lens designs without physical modifications.
Contribution
It introduces a user-friendly 'digital twin' simulation approach for TEM optics, facilitating innovation without risking instrument integrity or incurring high costs.
Findings
Simulation method accurately models TEM lens behavior
Allows rapid testing of new optical geometries
Encourages grassroots innovation in TEM design
Abstract
The transmission electron microscope (TEM) has become an essential tool for innovation in nanoscience, material science, and biology. Despite these instruments being widely used across both industry and academia, academics may hesitate to propose substantial modifications to the optical setup due to the instrument's significant purchase price, fear of voiding the service contract, or downtime being unacceptable in shared user facilities. For instruments found in industry, similarly the risk-reward balance makes substantive modifications untenable. This limits the development of radically new optical geometries, and with the performance of the TEM largely being dictated by the specification of the objective lens pole-piece, exploring novel designs may be valuable. Alternatively, potential lens designs can be analyzed rapidly and inexpensively using finite element analysis multiphysics…
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Taxonomy
TopicsAdvanced Electron Microscopy Techniques and Applications · Electron and X-Ray Spectroscopy Techniques · solar cell performance optimization
