Understanding the Robustness of Multi-Exit Models under Common Corruptions
Akshay Mehra, Skyler Seto, Navdeep Jaitly, Barry-John Theobald

TL;DR
This paper investigates how multi-exit models perform under common image corruptions, revealing that distribution shifts impact accuracy, calibration, and exit strategies, and introduces metrics to better understand and improve their robustness.
Contribution
The study provides a comprehensive empirical analysis of MEMs under corruptions, highlighting the effects of distribution shifts and proposing metrics to quantify early-exit behavior.
Findings
Early exits at the first correct layer boost accuracy by 10%.
Realistic early-exit strategies yield only 1% accuracy improvement under corruptions.
Distribution shifts increase misclassification and calibration issues in MEMs.
Abstract
Multi-Exit models (MEMs) use an early-exit strategy to improve the accuracy and efficiency of deep neural networks (DNNs) by allowing samples to exit the network before the last layer. However, the effectiveness of MEMs in the presence of distribution shifts remains largely unexplored. Our work examines how distribution shifts generated by common image corruptions affect the accuracy/efficiency of MEMs. We find that under common corruptions, early-exiting at the first correct exit reduces the inference cost and provides a significant boost in accuracy ( 10%) over exiting at the last layer. However, with realistic early-exit strategies, which do not assume knowledge about the correct exits, MEMs still reduce inference cost but provide a marginal improvement in accuracy (1%) compared to exiting at the last layer. Moreover, the presence of distribution shift widens the gap between an MEM's…
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Taxonomy
TopicsImbalanced Data Classification Techniques
